Widianto, Widianto and Syafaah, Lailis and Nurhadi, Nurhadi (2016) OPEN DEFECT DETECTIONS OF CMOS ICS BY USING IDDQ TESTING. In: Seminar Nasional Teknologi dan Rekayasa (SENTRA). Universitas Muhammadiyah Malang, Malang, pp. 188-190. ISBN ISSN (Cetak) 2527-6042 eISSN (Online) 2527-6050
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Abstract
An I
DDQ testing is proposed to detect an open defect at an input gate in a CMOS IC. The testing is based on measuring a
quiescent supply current IDDQ on the IC. When the open defect occurs at the input gate, the large IDDQ will flow to the IC
regardless test input vectors which generate to it. On the other hand, in the defect-free IC, the large IDDQ does not flow to the
IC. The testing is implemented in the CMOS IC designed by a Spice net list library of NXP Co. Ltd and is examined using a
Spice simulation. Simulation results show that the open defect can be detected by the IDDQ testing.
| Item Type: | Book Section / Proceedings |
|---|---|
| Keywords: | IDDQ testing, open defect, input gate, CMOS IC |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Faculty of Engineering > Department of Electrical Engineering (20201) |
| Depositing User: | faruq Amrul Faruq |
| Date Deposited: | 06 Sep 2024 06:11 |
| Last Modified: | 06 Sep 2024 06:11 |
| URI: | https://eprints.umm.ac.id/id/eprint/10877 |
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