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Book Section / Proceedings
Widianto, Widianto and Syafaah, Lailis and Nurhadi, Nurhadi (2016) OPEN DEFECT DETECTIONS OF CMOS ICS BY USING IDDQ TESTING. In: Seminar Nasional Teknologi dan Rekayasa (SENTRA). Universitas Muhammadiyah Malang, Malang, pp. 188-190. ISBN ISSN (Cetak) 2527-6042 eISSN (Online) 2527-6050
Hendaryati, Heni and Syafaah, Lailis and Agustini, Sulistiyo and Respati, Bertha (2016) SISTEM PENDUKUNG KEPUTUSAN UNTUK KLASIFIKASI KOMPLIKASI DIABETES MELLITUS TIPE 2 BERDASARKAN PERKENI. In: Proceedings SENTRA UMM. UMM.